Document Type

Article

Publication Date

6-1993

Abstract

This work addresses the effect of finite sample thickness on microwave dielectric constant measurements for thin, planar, low-loss samples using the open-ended coaxial-line probe method. Detailed measurements of the dielectric constant were carried out on a wide range of thicknesses of air samples which were backed by infinitely thick teflon and alumina dielectric media. The measurements were made at room temperature for various (50 Ω) coaxial-line dimensions, microwave frequencies 4-8 GHz, and power levels near a fraction of a mW. The results provide strong support for previously published theoretical calculations based on a boundary value problem which uses a spectral domain formulation for the aperture fields. From thin, planar samples, values of 10.44±0.5 and 25.9±1.3 were obtained at 5 GHz and 300 K for the bulk dielectric constant of MgO and LaAl[sub 2]O[sub 3], respectively. The applicability of a simple empirical model based on an exponential fit is discussed.

Publisher Statement

Permission has been granted by Review of Scientific Instruments to supply this article [http://dx.doi.org/10.1063/1.114403] for educational and research purposes. More info can be found at http://aip.scitation.org/journal/rsi. © AIP Publishing.

Recommended Citation

G. Q. Jiang, W. H. Wong, E. Y. Raskovich, W. G. Clark, W. A. Hines, and J. Sanny, Review Of Scientific Instruments 64, 1622 (1993); doi: 10.1063/1.114403

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