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Measurement of the microwave dielectric constant for low‐loss samples with finite thickness using open‐ended coaxial‐line probes, G. Q. Jiang, W. H. Wong, E. Y. Raskovich, W. G. Clark, W. A. Hines, Jeff Sanny Physics Faculty Works
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Low-temperature magnetic properties of submetallic phosphorous-doped silicon, C. T. Murayama, W. G. Clark, Jeff Sanny Physics Faculty Works
Frequency-Dependent Conductivity in NbSe3, G. Gruner, L. C. Tippie, Jeff Sanny, W. G. Clark, N. P. Ong Physics Faculty Works
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